发明名称 |
DSA GRAPHO-EPITAXY PROCESS WITH ETCH STOP MATERIAL |
摘要 |
A method for defining a template for directed self-assembly (DSA) materials includes forming an etch stop layer on a neutral material, forming a mask layer on the etch stop layer and forming an anti-reflection coating (ARC) on the mask layer. A resist layer is patterned on the ARC using optical lithography to form a template pattern. The ARC and the mask layer are reactive ion etched down to the etch stop layer in accordance with the template pattern to form a template structure. The ARC is removed from the mask layer and the template structure is trimmed to reduce a width of the template structure. A wet etch is performed to remove the etch stop layer to permit the neutral material to form an undamaged DSA template for DSA materials. |
申请公布号 |
US2014256145(A1) |
申请公布日期 |
2014.09.11 |
申请号 |
US201313793739 |
申请日期 |
2013.03.11 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
ABDALLAH JASSEM A.;COLBURN MATTHEW E.;HOLMES STEVEN J.;KAWAMURA DAIJI;LIU CHI-CHUN;SANKARAPANDIAN MUTHUMANICKAM;YIN YUNPENG |
分类号 |
H01L21/308 |
主分类号 |
H01L21/308 |
代理机构 |
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代理人 |
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主权项 |
1. A method for defining a template for directed self-assembly (DSA) materials, comprising:
forming an etch stop layer on a neutral material; forming a mask layer on the etch stop layer; forming an anti-reflection coating (ARC) on the mask layer; patterning a resist layer using optical lithography to form a template pattern; reactive ion etching the ARC and the mask layer down to the etch stop layer in accordance with the template pattern to form a template structure; removing the ARC from the mask layer and trimming the template structure to reduce a width of the template structure; and performing a wet etch to remove the etch stop layer to permit the neutral material to form an undamaged DSA template for DSA materials. |
地址 |
Armonk NY US |