发明名称 Nanodot-Enhanced Hybrid Floating Gate for Non-Volatile Memory Devices
摘要 A memory device and a method of making a memory device that includes a semiconductor channel, a tunnel dielectric layer located over the semiconductor channel, a floating gate located over the tunnel dielectric layer, the floating gate comprising a continuous layer of an electrically conductive material and at least one protrusion of an electrically conductive material facing the tunnel dielectric layer and electrically shorted to the continuous layer, a blocking dielectric region located over the floating gate, and a control gate located over the blocking dielectric layer.
申请公布号 US2014252447(A1) 申请公布日期 2014.09.11
申请号 US201313792662 申请日期 2013.03.11
申请人 SANDISK TECHNOLOGIES, INC. 发明人 Lee Donovan;Kai James K.;Samachisa George;Chien Henry;Matamis George;Purayath Vinod R.
分类号 H01L29/788;H01L29/66 主分类号 H01L29/788
代理机构 代理人
主权项 1. A memory device, comprising: a semiconductor channel; a tunnel dielectric layer located over the semiconductor channel; a floating gate located over the tunnel dielectric layer, the floating gate comprising a continuos layer of an electrically conductive material and at least one protrusion of an electrically conductive material facing the tunnel dielectric layer and electrically shorted to the continuos layer; a blocking dielectric region located over the floating gate; and a control gate located over the blocking dielectric layer.
地址 Plano TX US