发明名称 |
Semiconductor device |
摘要 |
The semiconductor device includes: a semiconductor substrate (SUB); a pair of injection elements (DR); an active barrier structure (AB) ; and a p-type ground region (PGD). The semiconductor substrate has a main surface and a p-type (PSR) region formed therein. The active barrier structure (AB) is arranged in a region sandwiched between the pair of injection elements over the main surface. The p-type ground region (PGD) is a ground potential-applicable region which is formed closer to an end side of the main surface than the pair of injection elements (DR) and the active barrier structure (AB), bypassing a region sandwiched between the pair of injection elements (DR) over the main surface, and which is electrically coupled to the p-type region (PSR). The p-type ground region is divided by a region adjacent to the region sandwiched between the pair of injection elements. |
申请公布号 |
EP2463907(A3) |
申请公布日期 |
2014.09.10 |
申请号 |
EP20110188131 |
申请日期 |
2011.11.07 |
申请人 |
RENESAS ELECTRONICS CORPORATION |
发明人 |
YOSHIHISA, YASUKI;NITTA, TETSUYA |
分类号 |
H01L27/088;H01L21/761;H01L21/8234 |
主分类号 |
H01L27/088 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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