发明名称 Sample processing apparatus for a sample rack set, and sample processing method
摘要 <p>A sample processing apparatus comprises a transporting section configured to transport a sample rack that is capable of holding a sample container at a plurality of holding positions, a detecting section that is configured to detect presence or absence of a rack distinction member at a holding position of the sample rack, an aspirating section that is configured to aspirate a sample in the sample container, and a control section that is configured to control an aspirating operation of the aspirating section. The control section changes an aspirating operation with respect to the sample container held in the sample rack based on the presence or absence of the rack distinction member at the holding position of the sample rack.</p>
申请公布号 EP2774678(A1) 申请公布日期 2014.09.10
申请号 EP20140157210 申请日期 2014.02.28
申请人 SYSMEX CORPORATION 发明人 TANAKA, TOSHIHISA
分类号 B01L3/00;B01L9/06;G01N35/00;G01N35/02 主分类号 B01L3/00
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