| 摘要 |
FIELD: testing technology.SUBSTANCE: invention relates to microelectronics, namely to methods for testing of integrated circuits (ICs) on the corrosion resistance. Essence: before testing ICs the appearance and electrical parameters are checked, and the leak check is carried out, they are heated to the temperature plus 125°C with the speed not exceeding 100°C/min, kept at this temperature for 1 h, quenched to minus 55°C with the speed not exceeding 100°C/min, kept at this temperature for 0.5 h, warmed gradually to plus 2°C for 1 h. and kept for 0.5 hour. At least 16 continuous consecutive cycles are carried out of 3 hours each.EFFECT: improving the objective assessment of moisture inside the IC housing.1 dwg |
