发明名称 |
An X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus |
摘要 |
An X-ray diffraction method of mapping grain structures in a polycrystalline material sample (3), where an X-ray detector detects (12) spots or substantially line-shaped segments (13a-f) from beams diffracted from at least some of the grains. A processing device analyses values received from the X-ray detector (12) and identifies at least the position of spots or the line-shaped segments to generate a 3D model of the polycrystalline material. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain. |
申请公布号 |
EP2775296(A1) |
申请公布日期 |
2014.09.10 |
申请号 |
EP20140157972 |
申请日期 |
2014.03.05 |
申请人 |
DANMARKS TEKNISKE UNIVERSITET;CARL ZEISS X-RAY MICROSCOPY, INC. |
发明人 |
LAURIDSEN, ERIK;POULSEN, STEFAN OTHMAR;REISCHIG, PÉTER |
分类号 |
G01N23/207 |
主分类号 |
G01N23/207 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|