发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>A semiconductor device which can reduce a heat stress to a solder layer with suppressing an increase of thermal resistance is provided. A semiconductor device comprises a semiconductor element (5), a solder layer (4) which is arranged on at least one surface of the semiconductor element and a lead frame (2) which is arranged on the solder layer so that a porous nickel plating part (1) is sandwiched between the lead frame and the solder layer. Compared with a case that the semiconductor element and the lead frame are jointed by a solder directly, an increased part of a thermal resistance of the solder junction is held down only to a part of the porous nickel plating part and a thermal resistance applied to the solder layer can be reduced.</p>
申请公布号 EP2775515(A1) 申请公布日期 2014.09.10
申请号 EP20120837653 申请日期 2012.10.01
申请人 PANASONIC CORPORATION 发明人 IKUTA, KEIKO;JIN, LIANJI;HIROSE, TAKAYUKI;KOJIMA, TOSHIYUKI;TSUKAHARA, NORIHITO;TANDA, KOHICHI
分类号 H01L23/495;H01L21/60 主分类号 H01L23/495
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