Low power compression of incompatible test cubes

摘要

Disclosed are representative embodiments of methods, apparatus, and systems for power aware test applications involving deterministic clustering of test cubes with conflicts. Embodiments of the disclosed technology can be used to generate low toggling parent patterns to reduce power consumption during testing an integrated circuit. The power consumption may be further reduced by generating low toggling control patterns.

主权项

1. A method of low power compression of incompatible test cubes, comprising:
generating a low toggling parent pattern using a first decompressor unit; generating an incremental pattern using a second decompressor unit; generating a control pattern using a third decompressor unit; generating a test pattern using combination circuitry to combine the low toggling parent pattern and the incremental pattern based on the control pattern; and loading the test pattern to a plurality of scan chains, wherein the third decompressor unit receives data related to the control pattern from a ring generator in the first decompressor unit.