发明名称 |
Non-volatile memory with resistive access component |
摘要 |
Some embodiments include apparatus and methods having a memory element configured to store information and an access component configured to allow conduction of current through the memory element when a first voltage difference in a first direction across the memory element and the access component exceeds a first voltage value and to prevent conduction of current through the memory element when a second voltage difference in a second direction across the memory element and the access component exceeds a second voltage value, wherein the access component includes a material excluding silicon. |
申请公布号 |
US8830738(B2) |
申请公布日期 |
2014.09.09 |
申请号 |
US201313758644 |
申请日期 |
2013.02.04 |
申请人 |
Micron Technology, Inc. |
发明人 |
Liu Jun;Violette Michael P. |
分类号 |
G11C11/00 |
主分类号 |
G11C11/00 |
代理机构 |
Schwegman Lundberg & Woessner, P.A. |
代理人 |
Schwegman Lundberg & Woessner, P.A. |
主权项 |
1. An apparatus comprising:
a memory element including memory material configured to store information; andan access component coupled in series with the memory element and configured to enable conduction of current through the memory element, the access component includes a material, wherein the material excludes silicon and includes a bipolar switching material, and the access component includes a conduction path formed by one of ions and vacancies of the material of the access component when a voltage difference across the memory element and the access component exceeds a voltage value; and
an electrode between the memory element and the access component. |
地址 |
Boise ID US |