发明名称 Non-volatile memory with resistive access component
摘要 Some embodiments include apparatus and methods having a memory element configured to store information and an access component configured to allow conduction of current through the memory element when a first voltage difference in a first direction across the memory element and the access component exceeds a first voltage value and to prevent conduction of current through the memory element when a second voltage difference in a second direction across the memory element and the access component exceeds a second voltage value, wherein the access component includes a material excluding silicon.
申请公布号 US8830738(B2) 申请公布日期 2014.09.09
申请号 US201313758644 申请日期 2013.02.04
申请人 Micron Technology, Inc. 发明人 Liu Jun;Violette Michael P.
分类号 G11C11/00 主分类号 G11C11/00
代理机构 Schwegman Lundberg & Woessner, P.A. 代理人 Schwegman Lundberg & Woessner, P.A.
主权项 1. An apparatus comprising: a memory element including memory material configured to store information; andan access component coupled in series with the memory element and configured to enable conduction of current through the memory element, the access component includes a material, wherein the material excludes silicon and includes a bipolar switching material, and the access component includes a conduction path formed by one of ions and vacancies of the material of the access component when a voltage difference across the memory element and the access component exceeds a voltage value; and an electrode between the memory element and the access component.
地址 Boise ID US