发明名称 Exposure apparatus
摘要 An extreme ultraviolet exposure apparatus includes a radiation system configured to supply a beam of extreme ultraviolet radiation; a support configured to support a patterning device, the patterning device configured to pattern the beam of extreme ultraviolet radiation according to a desired pattern; a substrate table having an area configured to support a substrate; a projection system configured to project the patterned beam of extreme ultraviolet radiation onto a target portion of the substrate, the projection system comprising a reflective optical system; wherein at least a part of the apparatus that during use of the apparatus is exposed to the beam of extreme ultraviolet radiation is coated with a coating, the coating comprising a metal oxide, or a photocatalyst, or a semiconductor, or any combination thereof.
申请公布号 US8830446(B2) 申请公布日期 2014.09.09
申请号 US201313928203 申请日期 2013.06.26
申请人 ASML Netherlands B.V. 发明人 Boogaard Arjen;Sengers Timotheus Franciscus;Ketelaars Wilhelmus Sebastianus Marcus Maria;Spee Carolus Ida Maria Antonius
分类号 G03B27/42;G03B27/52;G03F7/20 主分类号 G03B27/42
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. An extreme ultraviolet exposure apparatus comprising: a radiation system configured to supply a beam of extreme ultraviolet radiation; a support configured to support a patterning device, the patterning device configured to pattern the beam of extreme ultraviolet radiation according to a desired pattern; a substrate table having an area configured to support a substrate; a projection system configured to project the patterned beam of extreme ultraviolet radiation onto a target portion of the substrate, the projection system comprising a reflective optical system; wherein at least a part of the apparatus that during use of the apparatus is exposed to the beam of extreme ultraviolet radiation is coated with an outer coating, the outer coating comprising a metal oxide, or a photocatalyst, or a semiconductor selected from the group consisting of: TiO2, SrTiO3, Fe2O3, WO3, and CdS, or any combination thereof, and wherein the part of the apparatus is part of the projection system or includes a sensor on the substrate table.
地址 Veldhoven NL