发明名称 |
Exposure apparatus |
摘要 |
An extreme ultraviolet exposure apparatus includes a radiation system configured to supply a beam of extreme ultraviolet radiation; a support configured to support a patterning device, the patterning device configured to pattern the beam of extreme ultraviolet radiation according to a desired pattern; a substrate table having an area configured to support a substrate; a projection system configured to project the patterned beam of extreme ultraviolet radiation onto a target portion of the substrate, the projection system comprising a reflective optical system; wherein at least a part of the apparatus that during use of the apparatus is exposed to the beam of extreme ultraviolet radiation is coated with a coating, the coating comprising a metal oxide, or a photocatalyst, or a semiconductor, or any combination thereof. |
申请公布号 |
US8830446(B2) |
申请公布日期 |
2014.09.09 |
申请号 |
US201313928203 |
申请日期 |
2013.06.26 |
申请人 |
ASML Netherlands B.V. |
发明人 |
Boogaard Arjen;Sengers Timotheus Franciscus;Ketelaars Wilhelmus Sebastianus Marcus Maria;Spee Carolus Ida Maria Antonius |
分类号 |
G03B27/42;G03B27/52;G03F7/20 |
主分类号 |
G03B27/42 |
代理机构 |
Pillsbury Winthrop Shaw Pittman LLP |
代理人 |
Pillsbury Winthrop Shaw Pittman LLP |
主权项 |
1. An extreme ultraviolet exposure apparatus comprising:
a radiation system configured to supply a beam of extreme ultraviolet radiation; a support configured to support a patterning device, the patterning device configured to pattern the beam of extreme ultraviolet radiation according to a desired pattern; a substrate table having an area configured to support a substrate; a projection system configured to project the patterned beam of extreme ultraviolet radiation onto a target portion of the substrate, the projection system comprising a reflective optical system; wherein at least a part of the apparatus that during use of the apparatus is exposed to the beam of extreme ultraviolet radiation is coated with an outer coating, the outer coating comprising a metal oxide, or a photocatalyst, or a semiconductor selected from the group consisting of: TiO2, SrTiO3, Fe2O3, WO3, and CdS, or any combination thereof, and wherein the part of the apparatus is part of the projection system or includes a sensor on the substrate table. |
地址 |
Veldhoven NL |