发明名称 |
Nitride-based semiconductor substrate and semiconductor device |
摘要 |
A nitride-based semiconductor substrate has a diameter of 25 mm or more, a thickness of 250 micrometers or more, a n-type carrier concentration of 1.2×1018 cm−3 or more and 3×1019 cm−3 or less, and a thermal conductivity of 1.2 W/cmK or more and 3.5 W/cmK or less. Alternatively, the substrate has an electron mobility μ [cm2/Vs] of more than a value represented by loge μ=17.7−0.288 loge n and less than a value represented by loge μ=18.5−0.288 loge n, where the substrate has a n-type carrier concentration n [cm−3] that is 1.2×1018 cm−3 or more and 3×1019 cm−3 or less. |
申请公布号 |
US8829651(B2) |
申请公布日期 |
2014.09.09 |
申请号 |
US200611397931 |
申请日期 |
2006.04.05 |
申请人 |
Hitachi Metals, Ltd. |
发明人 |
Oshima Yuichi |
分类号 |
H01L29/20 |
主分类号 |
H01L29/20 |
代理机构 |
McGinn IP Law Group, PLLC |
代理人 |
McGinn IP Law Group, PLLC |
主权项 |
1. A nitride-based semiconductor substrate, comprising:
a substrate comprising a nitride-based semiconductor, wherein the substrate comprises:
a diameter of 25 mm or more;a thickness of 250 micrometers or more;a dislocation density of 1×107 cm−2 or less;an oxygen impurity concentration of 1016 cm−3 or less;an n-type carrier concentration in a range of 1.2×1018 cm−3 to 3×1019 cm−3; anda thermal conductivity in a range of 1.2 W/cmK to 3.5 W/cmK. |
地址 |
Tokyo JP |