发明名称 Semiconductor device and operating method thereof
摘要 A semiconductor device and an operating method thereof comprise peripheral circuits configured to apply an erase voltage to memory cells when performing an erase operation, and sense a voltage change of bit lines by an erase verification voltage applied to word lines of the memory cells when performing an erase verification operation to thereby detect cells which are not erased, and a control circuit configured to control the peripheral circuits by changing a sensing reference level for determining the voltage change of the bit lines when the cells which are not erased are detected when performing the erase verification operation, so that the erase verification operation is repeatedly performed.
申请公布号 US8830763(B2) 申请公布日期 2014.09.09
申请号 US201213602020 申请日期 2012.08.31
申请人 SK Hynix Inc. 发明人 Seo Shin Won
分类号 G11C16/16 主分类号 G11C16/16
代理机构 William & Park Associates Patent Ltd. 代理人 William & Park Associates Patent Ltd.
主权项 1. A semiconductor device comprising: peripheral circuits configured to apply an erase voltage to memory cells when performing an erase operation, and sense a voltage change of bit lines by an erase verification voltage applied to word lines of the memory cells when performing an erase verification operation to thereby detect cells which are not erased; and a control circuit configured to control the peripheral circuits by changing a sensing reference level for determining the voltage change of the bit lines when the cells which are not erased are detected when performing the erase verification operation, so that the erase verification operation is repeatedly performed, wherein the sensing reference level is changed by changing a level of a sensing signal applied to a switching element for connecting a sensing node of a page buffer and a selected bit line.
地址 Gyeonggi-do KR