发明名称 Communication device with testing
摘要 Communication devices and methods are disclosed, wherein a test signal is generated at a first frequency and a higher harmonic of said test signal is received and processed at a second frequency higher than said first frequency.
申请公布号 US8831071(B2) 申请公布日期 2014.09.09
申请号 US201012690909 申请日期 2010.01.20
申请人 Intel Mobile Communications GmbH 发明人 Hammes Markus;Van Waasen Stefan
分类号 H04B1/00;G01S19/23;G01S19/36 主分类号 H04B1/00
代理机构 代理人
主权项 1. A communication device, comprising: a first circuit portion comprising one or more components and configured during a regular mode to wirelessly receive and process communications signals at or near a first frequency; a second circuit portion comprising one or more components configured, during the regular mode, to wirelessly receive and process communication signals at or near a second frequency greater than the first frequency; wherein during a test mode, the first circuit portion is further configured to generate and wirelessly output a test signal comprising one or more harmonics at or around integer multiples of the first frequency with at least one harmonic of the test signal at or near the second frequency, wherein at least one circuit component of the first circuit portion used to receive or process communication signals at or near the first frequency during the regular mode has an inherent non-linearity that produces the one or more harmonics of the test signal during the test mode, and wherein during the test mode, the second circuit portion is further configured to wirelessly receive and thereafter process for test purposes the at least one harmonic of the test signal at or near the second frequency.
地址 Neubiberg DE