| 发明名称 | Brain repair using electrical stimulation of healthy nodes | ||
| 摘要 | A method and system of compensating for a damaged brain node is disclosed. The damaged node is determined by techniques such as fMRI or neural recording. A healthy node that can compensate for the function of the damaged node is determined. A stimulating electrode is placed on at least one functioning node to bypass the activity from the damaged node to compensate for a missing node. The functioning node is then stimulated to compensate for the damaged node. | ||
| 申请公布号 | US8831733(B2) | 申请公布日期 | 2014.09.09 |
| 申请号 | US201313943227 | 申请日期 | 2013.07.16 |
| 申请人 | California Institute of Technology | 发明人 | Wilke Melanie;Kagan Igor;Andersen Richard A. |
| 分类号 | A61N1/00;A61N1/36 | 主分类号 | A61N1/00 |
| 代理机构 | Nixon Peabody LLP | 代理人 | Tang Wayne L.;Nixon Peabody LLP |
| 主权项 | 1. A method of brain repair of a damaged node, comprising: determining the location of a damaged node within a brain circuit; determining at least one functioning node to compensate for the damaged node within the brain circuit; placing a stimulator on the brain on the at least one functioning node to bypass the activity from the damaged node to compensate for the damaged node; and stimulating the at least one functioning node to compensate for the damaged node. | ||
| 地址 | Pasadena CA US | ||