发明名称 Approach to integrate Schottky in MOSFET
摘要 An integrated structure combines field effect transistors and a Schottky diode. Trenches formed into a substrate composition extend along a depth of the substrate composition forming mesas therebetween. Each trench is filled with conductive material separated from the trench walls by dielectric material forming a gate region. Two first conductivity type body regions inside each mesa form wells partly into the depth of the substrate composition. An exposed portion of the substrate composition separates the body regions. Second conductivity type source regions inside each body region are adjacent to and on opposite sides of each well. Schottky barrier metal inside each well forms Schottky junctions at interfaces with exposed vertical sidewalls of the exposed portion of the substrate composition separating the body regions.
申请公布号 US8828857(B2) 申请公布日期 2014.09.09
申请号 US201313873017 申请日期 2013.04.29
申请人 Alpha and Omega Semiconductor Incorporated 发明人 Lui Sik;Su Yi;Ng Daniel;Bhalla Anup
分类号 H01L21/28;H01L21/02 主分类号 H01L21/28
代理机构 JDI Patent 代理人 Isenberg Joshua D.;JDI Patent
主权项 1. A method for forming an integrated structure combining one or more field effect transistors and a Schottky diode, the method comprising: a) forming a plurality of trenches formed into a semiconductor substrate and extending into the substrate thereby forming a plurality of mesas there between, each trench being substantially filled with a conductive material that is separated from the trench walls by a thin layer of dielectric material to form a gate region of one or more field effect transistors; b) forming at least two contact trenches in each mesa, each contact trench extending along a portion of depth of a doped body region of a first conductivity type opposite that of the substrate formed inside each mesa, whereby at least two contact trenches are separated by an exposed portion of the substrate, wherein each contact trench has an end that abuts the exposed portion of the substrate composition; c) forming a pair of doped source regions of a second conductivity type formed adjacent to and on opposite sides of each contact trench inside the doped body region; and d) forming a Schottky diode comprising Schottky barrier metal formed over the exposed portion of the substrate, the Schottky barrier metal forming a Schottky junction at an interface between the Schottky barrier metal and an exposed surface of the exposed portion of the substrate separating the two contact trenches.
地址 Sunnyvale CA US