发明名称 |
Semiconductor apparatus having fluorine containing region formed in recessed portion of semiconductor layer |
摘要 |
A semiconductor apparatus includes a first semiconductor layer formed on a substrate, a second semiconductor layer formed on the first semiconductor layer, a gate recess formed by removing at least a portion of the second semiconductor layer, an insulation film formed on the gate recess and the second semiconductor layer, a gate electrode formed on the gate recess via the insulation film, source and drain electrodes formed on one of the first and the second semiconductor layers, and a fluorine containing region formed in at least one of a part of the first semiconductor layer corresponding to a region in which the gate recess is formed and a part of the second semiconductor layer corresponding to the region in which the gate recess is formed. |
申请公布号 |
US8829569(B2) |
申请公布日期 |
2014.09.09 |
申请号 |
US201113290420 |
申请日期 |
2011.11.07 |
申请人 |
Fujitsu Limited |
发明人 |
Ohki Toshihiro;Endo Hiroshi |
分类号 |
H01L29/778;H01L29/423;H01L29/66;H01L29/20 |
主分类号 |
H01L29/778 |
代理机构 |
Kratz, Quintos & Hanson, LLP |
代理人 |
Kratz, Quintos & Hanson, LLP |
主权项 |
1. A semiconductor apparatus comprising:
a first semiconductor layer formed on a substrate; a second semiconductor layer formed on the first semiconductor layer; a gate recess formed by removing at least a portion of the second semiconductor layer; an insulation film formed on the gate recess and the second semiconductor layer; a gate electrode formed on the gate recess via the insulation film; source and drain electrodes formed on one of the first and the second semiconductor layers; and a fluorine containing region formed in at least one of a part of the first semiconductor layer corresponding to a region in which the gate recess is formed and a part of the second semiconductor layer corresponding to the region in which the gate recess is formed; wherein the first semiconductor layer is an electron transit layer, and the second semiconductor layer is an electron supply layer. |
地址 |
Kawasaki JP |