发明名称 Semiconductor apparatus having fluorine containing region formed in recessed portion of semiconductor layer
摘要 A semiconductor apparatus includes a first semiconductor layer formed on a substrate, a second semiconductor layer formed on the first semiconductor layer, a gate recess formed by removing at least a portion of the second semiconductor layer, an insulation film formed on the gate recess and the second semiconductor layer, a gate electrode formed on the gate recess via the insulation film, source and drain electrodes formed on one of the first and the second semiconductor layers, and a fluorine containing region formed in at least one of a part of the first semiconductor layer corresponding to a region in which the gate recess is formed and a part of the second semiconductor layer corresponding to the region in which the gate recess is formed.
申请公布号 US8829569(B2) 申请公布日期 2014.09.09
申请号 US201113290420 申请日期 2011.11.07
申请人 Fujitsu Limited 发明人 Ohki Toshihiro;Endo Hiroshi
分类号 H01L29/778;H01L29/423;H01L29/66;H01L29/20 主分类号 H01L29/778
代理机构 Kratz, Quintos & Hanson, LLP 代理人 Kratz, Quintos & Hanson, LLP
主权项 1. A semiconductor apparatus comprising: a first semiconductor layer formed on a substrate; a second semiconductor layer formed on the first semiconductor layer; a gate recess formed by removing at least a portion of the second semiconductor layer; an insulation film formed on the gate recess and the second semiconductor layer; a gate electrode formed on the gate recess via the insulation film; source and drain electrodes formed on one of the first and the second semiconductor layers; and a fluorine containing region formed in at least one of a part of the first semiconductor layer corresponding to a region in which the gate recess is formed and a part of the second semiconductor layer corresponding to the region in which the gate recess is formed; wherein the first semiconductor layer is an electron transit layer, and the second semiconductor layer is an electron supply layer.
地址 Kawasaki JP