发明名称 |
Magnetic memory including memory cells incorporating data recording layer with perpendicular magnetic anisotropy film |
摘要 |
A magnetic memory includes: a magnetization fixed layer having perpendicular magnetic anisotropy, a magnetization direction of the magnetization fixed layer being fixed; an interlayer dielectric; an underlayer formed on upper faces of the magnetization fixed layer and the interlayer dielectric; and a data recording layer formed on an upper face of the underlayer and having perpendicular magnetic anisotropy. The underlayer includes: a first magnetic underlayer; and a non-magnetic underlayer formed on the first magnetic underlayer. The first magnetic underlayer is formed with such a thickness that the first magnetic underlayer does not exhibit in-plane magnetic anisotropy in a portion of the first magnetic underlayer formed on the interlayer dielectric. |
申请公布号 |
US8830735(B2) |
申请公布日期 |
2014.09.09 |
申请号 |
US201113304083 |
申请日期 |
2011.11.23 |
申请人 |
Renesas Electronics Corporation |
发明人 |
Kariyada Eiji;Suemitsu Katsumi;Tanigawa Hironobu;Mori Kaoru;Suzuki Tetsuhiro;Nagahara Kiyokazu;Ozaki Yasuaki;Ohshima Norikazu |
分类号 |
G11B5/66;G11C11/16;G01R33/09;G11C11/02;G11C11/14;G11C11/15 |
主分类号 |
G11B5/66 |
代理机构 |
McGinn IP Law Group, PLLC |
代理人 |
McGinn IP Law Group, PLLC |
主权项 |
1. A magnetic memory, comprising:
a magnetization fixed layer having perpendicular magnetic anisotropy, a magnetization direction of said magnetization fixed layer being fixed; an amorphous interlayer dielectric; an underlayer formed on upper faces of said magnetization fixed layer and said interlayer dielectric; and a data recording layer formed on an upper face of said underlayer and having perpendicular magnetic anisotropy, wherein said underlayer includes:
a first underlayer formed in contact with the upper faces of said interlayer dielectric and said magnetization fixed layer; anda second underlayer formed on said first underlayer, wherein said second underlayer is non-magnetic, and wherein said first underlayer intrinsically exhibits ferromagnetism, while said first underlayer is formed with such a thickness that said first underlayer does not exhibit ferromagnetism in a portion of said first underlayer formed on said interlayer dielectric. |
地址 |
Kawasaki-Shi, Kanagawa JP |