发明名称 Transistor having sulfur-doped zinc oxynitride channel layer and method of manufacturing the same
摘要 Transistors having sulfur-doped zinc oxynitride channel layers, and methods of manufacturing the same, include a ZnON channel layer with sulfur content ratio with respect to a zinc content of from about 0.1 at % to about 1.2 at %, a source electrode and a drain electrode respectively formed on a first region and a second region of the channel layer, a gate electrode corresponding to the channel layer, and a gate insulation layer between the channel layer and the gate electrode.
申请公布号 US8829515(B2) 申请公布日期 2014.09.09
申请号 US201213721635 申请日期 2012.12.20
申请人 Samsung Electronics Co., Ltd.;Samsung Display Co., Ltd. 发明人 Seon Jong-baek;Kim Tae-sang;Kim Hyun-suk;Ryu Myung-kwan;Park Joon-seok;Seo Seok-jun;Son Kyoung-seok;Lee Sang-yoon
分类号 H01L29/06;H01L29/22;H01L29/786;H01L29/36 主分类号 H01L29/06
代理机构 Harness, Dickey & Pierce 代理人 Harness, Dickey & Pierce
主权项 1. A transistor, comprising: a ZnON channel layer with a sulfur (S) content ratio with respect to zinc (Zn) content of from about 0.1 at % to about 1.2 at %; a source electrode and a drain electrode respectively on a first region and a second region of the ZnON channel layer; a gate electrode corresponding to the channel layer; and a gate insulation layer between the ZnON channel layer and the gate electrode.
地址 Gyeonggi-do KR