发明名称 |
Transistor having sulfur-doped zinc oxynitride channel layer and method of manufacturing the same |
摘要 |
Transistors having sulfur-doped zinc oxynitride channel layers, and methods of manufacturing the same, include a ZnON channel layer with sulfur content ratio with respect to a zinc content of from about 0.1 at % to about 1.2 at %, a source electrode and a drain electrode respectively formed on a first region and a second region of the channel layer, a gate electrode corresponding to the channel layer, and a gate insulation layer between the channel layer and the gate electrode. |
申请公布号 |
US8829515(B2) |
申请公布日期 |
2014.09.09 |
申请号 |
US201213721635 |
申请日期 |
2012.12.20 |
申请人 |
Samsung Electronics Co., Ltd.;Samsung Display Co., Ltd. |
发明人 |
Seon Jong-baek;Kim Tae-sang;Kim Hyun-suk;Ryu Myung-kwan;Park Joon-seok;Seo Seok-jun;Son Kyoung-seok;Lee Sang-yoon |
分类号 |
H01L29/06;H01L29/22;H01L29/786;H01L29/36 |
主分类号 |
H01L29/06 |
代理机构 |
Harness, Dickey & Pierce |
代理人 |
Harness, Dickey & Pierce |
主权项 |
1. A transistor, comprising:
a ZnON channel layer with a sulfur (S) content ratio with respect to zinc (Zn) content of from about 0.1 at % to about 1.2 at %; a source electrode and a drain electrode respectively on a first region and a second region of the ZnON channel layer; a gate electrode corresponding to the channel layer; and a gate insulation layer between the ZnON channel layer and the gate electrode. |
地址 |
Gyeonggi-do KR |