发明名称 Charged particle beam lens having a particular support electrically insulating first and second electrodes from each other
摘要 A charged particle beam lens includes a first electrode including a surface having at least one aperture and a second electrode including a surface having at least one aperture. A support intervenes between the first electrode and the second electrode to electrically insulate the first and second electrodes from each other and to support the first and second electrodes in a predetermined positional relationship. A side surface of the support intervenes between the first electrode and the second electrode and includes a non-flat portion having at least one of a projected portion and a depressed portion, and includes a tapered portion. A taper angle formed by the tapered portion and the surface having the aperture of the second electrode is greater than zero degree and less than ninety degrees.
申请公布号 US8829465(B2) 申请公布日期 2014.09.09
申请号 US201214118963 申请日期 2012.05.10
申请人 Canon Kabushiki Kaisha 发明人 Tsunoda Koichi
分类号 H01J37/12;H01J37/00;H01J37/317 主分类号 H01J37/12
代理机构 Fitzpatrick, Cella, Harper & Scinto 代理人 Fitzpatrick, Cella, Harper & Scinto
主权项 1. A charged particle beam lens comprising: a first electrode including a surface having at least one aperture; a second electrode including a surface having at least one aperture; and a support intervening between the first electrode and the second electrode to electrically insulate the first and second electrodes from each other and to support the first and second electrodes in a predetermined positional relationship, wherein a side surface of the support intervening between the first electrode and the second electrode includes a non-flat portion having at least one of a projected portion and a depressed portion and includes a tapered portion, and wherein a taper angle formed by the tapered portion and the surface having the aperture of the second electrode is greater than zero degrees and less than ninety degrees.
地址 Tokyo JP