发明名称 |
Backside illumination (BSI) CMOS image sensor process |
摘要 |
A backside illumination (BSI) CMOS image sensing process includes the following steps. A substrate having an active side is provided. A curving process is performed to curve the active side. A reflective layer is formed on the active side, so that at least a curved mirror is formed on the active side. |
申请公布号 |
US8828779(B2) |
申请公布日期 |
2014.09.09 |
申请号 |
US201213665937 |
申请日期 |
2012.11.01 |
申请人 |
United Microelectronics Corp. |
发明人 |
Zhao Xin |
分类号 |
H01L21/00;H01L27/146;H01L31/0232 |
主分类号 |
H01L21/00 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A backside illumination (BSI) CMOS image sensing process, comprising:
providing a substrate having an active side; performing a curving process to curve the active side, wherein steps of performing the curving process comprise etching the substrate from the active side to form a plurality of recesses in the substrate; and performing an annealing process to curve the active side between each of the recesses; filling an isolating material into each of the recesses after the annealing process is performed; and forming a reflective layer on the active side, thereby forming at least a curved mirror on the active side. |
地址 |
Science-Based Industrial Park, Hsin-Chu TW |