发明名称 Backside illumination (BSI) CMOS image sensor process
摘要 A backside illumination (BSI) CMOS image sensing process includes the following steps. A substrate having an active side is provided. A curving process is performed to curve the active side. A reflective layer is formed on the active side, so that at least a curved mirror is formed on the active side.
申请公布号 US8828779(B2) 申请公布日期 2014.09.09
申请号 US201213665937 申请日期 2012.11.01
申请人 United Microelectronics Corp. 发明人 Zhao Xin
分类号 H01L21/00;H01L27/146;H01L31/0232 主分类号 H01L21/00
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A backside illumination (BSI) CMOS image sensing process, comprising: providing a substrate having an active side; performing a curving process to curve the active side, wherein steps of performing the curving process comprise etching the substrate from the active side to form a plurality of recesses in the substrate; and performing an annealing process to curve the active side between each of the recesses; filling an isolating material into each of the recesses after the annealing process is performed; and forming a reflective layer on the active side, thereby forming at least a curved mirror on the active side.
地址 Science-Based Industrial Park, Hsin-Chu TW