发明名称 Method of fabricating semiconductor package having substrate with solder ball connections
摘要 A semiconductor package includes a base substrate, a semiconductor chip mounted on the base substrate and including bonding pads, first and second connection terminals disposed adjacent to the semiconductor chip on the base substrate and electrically connected to the bonding pads, a first ball land disposed on the base substrate and electrically connected to the first connection terminal, a second ball land spaced apart from the connection terminals, the first ball land disposed between the second ball land and at least one of the first and second connection terminals, a first insulating layer covering the first ball land but exposing at least a part of the second ball land, and a first conductive wire extending onto the first insulating layer and connecting the second connection terminal to the second ball land.
申请公布号 US8828795(B2) 申请公布日期 2014.09.09
申请号 US201213616618 申请日期 2012.09.14
申请人 Samsung Electronics Co., Ltd. 发明人 Jo Sang-Gui;Park Ji-Yong;Bae Kwangjin;Lim Soyoung
分类号 H01L21/60;H01L23/498;H01L23/00 主分类号 H01L21/60
代理机构 Lee & Morse, P.C. 代理人 Lee & Morse, P.C.
主权项 1. A method of fabricating a semiconductor package, the method comprising: preparing a base substrate, the base substrate including a semiconductor chip mounting region; forming a first connection terminal, a second connection terminal, and a third connection terminal on the base substrate, the first, second, and third connection terminals being adjacent to the semiconductor chip mounting region and being spaced apart from each other; forming a first ball land on the base substrate and electrically connected to the first connection terminal; forming a second ball land spaced apart from the first connection terminal, the first ball land disposed between the second ball land and at least one of the first through third connection terminals; forming a third ball land spaced apart from the first and second connection terminals, the first and second ball lands disposed between the third ball land and at least one of the first through third connection terminals; forming an insulating layer that at least partially exposes at least one ball land out of the ball lands, the insulating layer covering at least another ball land adjacent to the connection terminals out of the ball lands; and forming a conductive wire that connects the at least one ball land exposed by the insulting layer to one of the connection terminals.
地址 Suwon-si, Gyeonggi-do KR