发明名称 COMPONENT ANALYZER AND COMPONENT ANALYZING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a component analyzer capable of performing detection of components in an inspection object with simple work in a short time, and a component analyzing method using the component analyzer.SOLUTION: A component analyzer 1 includes: a container 10 including a recess 11 for accommodating food (inspection object) 100; a lid part 13 for putting a lid on the recess 11 in an attachable/detachable manner; a spectroscopic analyzer 20 provided at the lid part 13 and receiving reflection light reflected from the whole area of the food 100 by irradiating the whole area of the recess 11 with inspection light; and a component analysis unit 50 for analyzing components of the food 100 on the basis of the reflection light.
申请公布号 JP2014163871(A) 申请公布日期 2014.09.08
申请号 JP20130036774 申请日期 2013.02.27
申请人 SEIKO EPSON CORP 发明人 SANO AKIRA;KOMATSU HIROSHI
分类号 G01N21/27;G01N21/35 主分类号 G01N21/27
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