发明名称 MONOMER, POLYMERIC COMPOUND, RESIST MATERIAL AND PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a monomer for a base resin of a photoresist material which is applicable to organic solvent development process and has a high dissolution contrast and high sensitivity, and to provide a polymeric compound obtained from the monomer, and a resist material comprising the polymeric compound as a base resin.SOLUTION: The polymeric compound is prepared by polymerizing a (meth)acrylate monomer having a specific structure which has, as a side chain, one or two ester structures connected through an alkyl chain via an ester bond. A negative photoresist composition is prepared by adding an acid generator to the polymeric compound. A photoresist film comprising a polymeric compound containing a repeating unit obtained from the monomer shows high solubility in an unexposed portion in a process of forming a positive-negative reversal image by organic solvent development.
申请公布号 JP2014162815(A) 申请公布日期 2014.09.08
申请号 JP20130032716 申请日期 2013.02.22
申请人 SHIN ETSU CHEM CO LTD 发明人 SAGEHASHI MASAYOSHI;HASEGAWA KOJI;KATAYAMA KAZUHIRO
分类号 C08F20/28;C07C69/54;G03F7/004;G03F7/038;G03F7/039;G03F7/11;G03F7/32;G03F7/38;H01L21/027 主分类号 C08F20/28
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