发明名称 |
MONOMER, POLYMERIC COMPOUND, RESIST MATERIAL AND PATTERN FORMING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a monomer for a base resin of a photoresist material which is applicable to organic solvent development process and has a high dissolution contrast and high sensitivity, and to provide a polymeric compound obtained from the monomer, and a resist material comprising the polymeric compound as a base resin.SOLUTION: The polymeric compound is prepared by polymerizing a (meth)acrylate monomer having a specific structure which has, as a side chain, one or two ester structures connected through an alkyl chain via an ester bond. A negative photoresist composition is prepared by adding an acid generator to the polymeric compound. A photoresist film comprising a polymeric compound containing a repeating unit obtained from the monomer shows high solubility in an unexposed portion in a process of forming a positive-negative reversal image by organic solvent development. |
申请公布号 |
JP2014162815(A) |
申请公布日期 |
2014.09.08 |
申请号 |
JP20130032716 |
申请日期 |
2013.02.22 |
申请人 |
SHIN ETSU CHEM CO LTD |
发明人 |
SAGEHASHI MASAYOSHI;HASEGAWA KOJI;KATAYAMA KAZUHIRO |
分类号 |
C08F20/28;C07C69/54;G03F7/004;G03F7/038;G03F7/039;G03F7/11;G03F7/32;G03F7/38;H01L21/027 |
主分类号 |
C08F20/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|