| 摘要 |
<p>The invention relates to a method (100) for inspecting a load (15), including the following steps: obtaining (102) at least one digitized image (20) of the load using a system for detection by means of transmitting X-rays; determining (104) areas of interest (40) of the digitized image from the values of the pixels (32) thereof, the areas of interest being subsets of the digitized image; allocating (106) a label (L) to each pixel of each area of interest, the allocated label being representative of the chemical nature and arrangement of the materials constituting the portion of the load that corresponds to the pixels; and displaying an image showing the labels allocated to the pixels. The allocation of the label to each pixel of each area of interest includes at least one overall statistical test carried out on the basis of the values of a group of pixels in the area of interest to which the pixel belongs, and at least one local test carried out on the basis of the value of the pixel. The invention also relates to the corresponding detection system.</p> |
