发明名称 |
METAL OXIDE SEMICONDUCTOR THIN FILM TRANSISTORS HAVING HIGH PERFORMANCE AND METHODS OF MANUFACTURING THE SAME |
摘要 |
<p>Disclosed are a thin film transistor with high performance and a manufacturing method thereof. The thin film transistor according to one embodiment of the present invention includes a gate electrode which is formed on a substrate, a gate insulation layer which is formed on the gate electrode, a channel layer which is formed on the gate insulation layer, a first electrode which covers one end of the channel layer, a second electrode which covers the other end of the channel layer, and a protective layer which covers the channel layer between the first and second electrodes. The channel layer includes an In-rich metal oxide layer. The protective layer is a single layer or multiple layers and includes at least aluminum oxide. The channel layer is processed by O2 HPA before or after the protective layer is formed.</p> |
申请公布号 |
KR20140106977(A) |
申请公布日期 |
2014.09.04 |
申请号 |
KR20130021386 |
申请日期 |
2013.02.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD.;INHA-INDUSTRY PARTNERSHIP INSTITUTE |
发明人 |
SON, KYOUNG SEOK;RYU, MYUNG KWAN;JEONG, JAE KYEONG |
分类号 |
H01L29/786;H01L21/336 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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