发明名称 METAL OXIDE SEMICONDUCTOR THIN FILM TRANSISTORS HAVING HIGH PERFORMANCE AND METHODS OF MANUFACTURING THE SAME
摘要 <p>Disclosed are a thin film transistor with high performance and a manufacturing method thereof. The thin film transistor according to one embodiment of the present invention includes a gate electrode which is formed on a substrate, a gate insulation layer which is formed on the gate electrode, a channel layer which is formed on the gate insulation layer, a first electrode which covers one end of the channel layer, a second electrode which covers the other end of the channel layer, and a protective layer which covers the channel layer between the first and second electrodes. The channel layer includes an In-rich metal oxide layer. The protective layer is a single layer or multiple layers and includes at least aluminum oxide. The channel layer is processed by O2 HPA before or after the protective layer is formed.</p>
申请公布号 KR20140106977(A) 申请公布日期 2014.09.04
申请号 KR20130021386 申请日期 2013.02.27
申请人 SAMSUNG ELECTRONICS CO., LTD.;INHA-INDUSTRY PARTNERSHIP INSTITUTE 发明人 SON, KYOUNG SEOK;RYU, MYUNG KWAN;JEONG, JAE KYEONG
分类号 H01L29/786;H01L21/336 主分类号 H01L29/786
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