| 发明名称 |
TESTING APPARATUS WITH BACKDRIVING PROTECTION FUNCTION |
| 摘要 |
A testing apparatus with a back-drive protection function is disclosed, where the testing apparatus includes a driver and a field programmable gate array (FPGA), where the driver is electrically connected to the FPGA. The FPGA can monitor output current from the driver and perform the back-drive protection function on the driver to protect device-under-test (DUT). |
| 申请公布号 |
US2014247530(A1) |
申请公布日期 |
2014.09.04 |
| 申请号 |
US201313897287 |
申请日期 |
2013.05.17 |
| 申请人 |
TEST RESEARCH, INC. |
发明人 |
KUO Po-Shen;CHEN Hsin-Hao |
| 分类号 |
H02H3/08 |
主分类号 |
H02H3/08 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A testing apparatus with a back-drive protection function, the testing apparatus comprising:
at least one driver; and a field programmable gate array (FPGA) electrically connected to the driver for monitoring output current from the driver and performing the back-drive protection function on the driver. |
| 地址 |
Taipei City TW |
