发明名称 ATTACHED MATTER DETECTOR, AND ATTACHED MATTER DETECTION METHOD
摘要 An attached matter detector includes: a light source that emits light to a transparent member; imaging device that receives light emitted from the light source and reflected by an attached matter on the transparent member, and consecutively images an image of the attached matter at a predetermined imaging frequency; and an attached matter detection processor that detects the attached matter based on an image imaged by the imaging device, wherein the light source emits light that flickers at a drive frequency different from the imaging frequency, and the imaging device receives the reflected light via an optical filter that selects and transmits the reflected light, and the attached matter detection processor detects a beat on an image generated by a difference between the imaging frequency and the drive frequency, and identifies an image region where the beat is detected as an attached matter image region.
申请公布号 US2014247357(A1) 申请公布日期 2014.09.04
申请号 US201214352197 申请日期 2012.11.27
申请人 Sekiguchi Hiroyoshi 发明人 Sekiguchi Hiroyoshi
分类号 H04N7/18;H04N5/225 主分类号 H04N7/18
代理机构 代理人
主权项 1. An attached matter detector comprising: a light source that emits light to a transparent member; an imaging device that receives light that is emitted from the light source and reflected by attached matter attached on the transparent member by an image sensor, a light-receiving element of which is structured by a two-dimensionally-arranged imaging pixel array, and consecutively images an image of the attached matter attached on the transparent member at a predetermined imaging frequency; and an attached matter detection processor that detects the attached matter based on an image imaged by the imaging device,wherein the light source emits light that flickers at a drive frequency that is different from the imaging frequency, and the imaging device receives the reflected light by the image sensor via an optical filter that selects and transmits the reflected light, and the attached matter detection processor detects a beat on an image generated by a difference between the imaging frequency and the drive frequency, and identifies an image region where the beat is detected as an attached matter image region where the attached matter is shown.
地址 Yokohama-shi JP
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