发明名称 MIXED VALENT OXIDE MEMORY AND METHOD
摘要 Memory devices and methods of forming include a mixed valent oxide located between a first electrode and a second electrode. Implantation of a metal below a surface of one of the electrodes allows formation of the mixed valent oxide with a direct interface to the electrode. An intermetallic oxide can be subsequently formed between the mixed valent oxide and the electrode by annealing the structure.
申请公布号 US2014248740(A1) 申请公布日期 2014.09.04
申请号 US201414277221 申请日期 2014.05.14
申请人 Micron Technology, Inc. 发明人 Sandhu Gurtej S.
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
主权项 1. A method, comprising: implanting metal ions below a surface of a platinum electrode; implanting oxygen below the surface of the platinum electrode; forming a mixed valent oxide using the platinum electrode as a seed layer; annealing to move the metal ions and oxygen from below the surface of the platinum electrode to an interface between the mixed valent oxide and the platinum electrode; and combining the metal ions and the implanted oxygen to form an intermetallic oxide at the interface.
地址 Boise ID US