发明名称 |
MIXED VALENT OXIDE MEMORY AND METHOD |
摘要 |
Memory devices and methods of forming include a mixed valent oxide located between a first electrode and a second electrode. Implantation of a metal below a surface of one of the electrodes allows formation of the mixed valent oxide with a direct interface to the electrode. An intermetallic oxide can be subsequently formed between the mixed valent oxide and the electrode by annealing the structure. |
申请公布号 |
US2014248740(A1) |
申请公布日期 |
2014.09.04 |
申请号 |
US201414277221 |
申请日期 |
2014.05.14 |
申请人 |
Micron Technology, Inc. |
发明人 |
Sandhu Gurtej S. |
分类号 |
H01L45/00 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method, comprising:
implanting metal ions below a surface of a platinum electrode; implanting oxygen below the surface of the platinum electrode; forming a mixed valent oxide using the platinum electrode as a seed layer; annealing to move the metal ions and oxygen from below the surface of the platinum electrode to an interface between the mixed valent oxide and the platinum electrode; and combining the metal ions and the implanted oxygen to form an intermetallic oxide at the interface. |
地址 |
Boise ID US |