发明名称 |
Semiconductor Device with Charge Compensation Structure |
摘要 |
A semiconductor device is provided. The semiconductor device includes a semiconductor body having a main surface. In a vertical cross-section which is substantially orthogonal to the main surface the semiconductor body includes a vertical trench, an n-type silicon semiconductor region, and two p-type silicon semiconductor regions each of which adjoins the n-type silicon semiconductor region and is arranged between the n-type silicon semiconductor region and the main surface. The vertical trench extends from the main surface at least partially into the n-type silicon semiconductor region and includes a compound semiconductor region which includes silicon and germanium and is arranged between the two p-type silicon semiconductor regions. The compound semiconductor region and the two p-type silicon semiconductor regions include n-type dopants and p-type dopants. An integrated concentration of the n-type dopants of the compound semiconductor region is larger than an integrated concentration of the p-type dopants of the compound semiconductor region. |
申请公布号 |
US2014246697(A1) |
申请公布日期 |
2014.09.04 |
申请号 |
US201313782563 |
申请日期 |
2013.03.01 |
申请人 |
INFINEON TECHNOLOGIES AUSTRIA AG |
发明人 |
Schulze Hans-Joachim;Weber Hans;Knoefler Roman;Hirler Franz |
分类号 |
H01L29/165;H01L21/02;H01L29/78 |
主分类号 |
H01L29/165 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a semiconductor body having a main surface, in a vertical cross-section which is substantially orthogonal to the main surface, the semiconductor body comprising:
an n-type silicon semiconductor region;two p-type silicon semiconductor regions each of which adjoins the n-type silicon semiconductor region and is arranged between the n-type silicon semiconductor region and the main surface; anda vertical trench extending from the main surface at least partially into the n-type silicon semiconductor region and comprising a compound semiconductor region which comprises silicon and germanium and is arranged between the two p-type silicon semiconductor regions, wherein the compound semiconductor region and the two p-type silicon semiconductor regions comprise n-type dopants and p-type dopants, and an integrated concentration of the n-type dopants of the compound semiconductor region is larger than an integrated concentration of the p-type dopants of the compound semiconductor region. |
地址 |
Villach AT |