发明名称 MAGNETORESISTIVE MEMORY CELL AND METHOD OF MANUFACTURING THE SAME
摘要 A STT-MRAM comprises apparatus and a method of manufacturing a spin-torque magnetoresistive memory and a plurality of a three-terminal magnetoresistive memory element having a voltage-gated recording. The first terminal, a bit line, is connected to the top magnetic reference layer, and the second terminal is located at the middle recording layer which is connected to the underneath select CMOS transistor through a VIA and the third one, a digital line, is a voltage gate with a narrow pillar underneath the memory layer across an insulating functional layer which is used to reduce the write current by manipulating the perpendicular anisotropy of the recording layer. The fabrication includes formation of a bottom electrode, formation of digital line, formation of memory cell & VIA connection and formation of the top bit line. Photolithography patterning and hard mask etch are used to form the digital line pillar and small memory pillar. Ion implantation is used to convert a buried dielectric layer outside the center memory pillar into an electric conductive path between middle recording layer and underneath CMOS transistor.
申请公布号 US2014246741(A1) 申请公布日期 2014.09.04
申请号 US201414194742 申请日期 2014.03.02
申请人 Guo Yimin 发明人 Guo Yimin
分类号 H01L43/02;H01L43/12 主分类号 H01L43/02
代理机构 代理人
主权项 1. A method of manufacturing a magnetoresistive memory cell comprising: a bottom electrode provided on a surface of a substrate and coupled a select transistor through a conductive VIA; a first interlayer dielectric layer provided on a surface of the bottom electrode; a digital line provided on a surface of the interlayer dielectric layer; a second dielectric layer provided on side walls of the digital line; a dielectric functional layer provided on the top surface of the digital line layer; a memory recording layer provided on the top surface of the dielectric functional layer having a magnetic anisotropy and a variable magnetization direction and having a induced perpendicular anisotropy from an interface interaction with the functional layer; a bottom connection layer provided on outside walls of the second dielectric layer and electrically connecting the recording layer and the bottom electrode; a tunnel barrier layer provided on the top surface of the recording layer; a magnetic reference layer provided on the top surface of the tunnel barrier having magnetic anisotropy and having a fixed magnetization direction; a cap layer provided on the top surface of the reference layer as an upper electric electrode; a bit line provided on the top surface of the cap layer.
地址 SAN JOSE CA US