发明名称 MULTI-TIERED SEMICONDUCTOR DEVICES AND ASSOCIATED METHODS
摘要 Methods of fabricating multi-tiered semiconductor devices are described, along with apparatus and systems that include them. In one such method, a first dielectric is formed, and a second dielectric is formed in contact with the first dielectric. A channel is formed through the first dielectric and the second dielectric with a first etch chemistry, a void is formed in the first dielectric with a second etch chemistry, and a device is formed at least partially in the void in the first dielectric. Additional embodiments are also described.
申请公布号 US2014246716(A1) 申请公布日期 2014.09.04
申请号 US201414274933 申请日期 2014.05.12
申请人 Micron Technology, Inc. 发明人 Sinha Nishant
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项 1. An apparatus comprising: a plurality of tiers of a first dielectric interleaved with a plurality of devices, each device being disposed between adjacent ones of the tiers of the first dielectric; and residual second dielectric on one of the tiers of the first dielectric.
地址 Boise ID US
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