发明名称 ELECTRODE PATTERN INSPECTING APPARATUS AND ELECTRODE PATTERN INSPECTING APPARATUS SYSTEM HAVING THE SAME
摘要 A device for testing electrode patterns includes a probe unit, a connection medium unit, a probe unit storage unit, a connection medium unit mounting unit, and an adjustment unit. The probe unit includes a probe to test the connection state of an electrode pattern. The connection medium unit includes a medium unit to mediate the electrical connection between the probe and the outside. The probe unit storage unit stores the probe unit to be detachable. On the connection medium unit mounting unit, the connection medium unit is mounted, and the connection medium unit mounting unit is placed to face the probe unit storage unit for the medium unit to face the probe. The adjustment unit is placed between at least the probe unit storage unit and the connection medium mounting unit and adjusts the interval between the probe unit storage unit and the connection medium mounting unit as external force is applied to make the probe and the medium unit be in contact with each other or be separated from each other. Therefore, it is possible to reduce time for replacing the probe, improve convenience of an operator, and remove inconvenience of re-setting.
申请公布号 KR101436294(B1) 申请公布日期 2014.09.03
申请号 KR20130120421 申请日期 2013.10.10
申请人 RORZE SYSTEMS CORPORATION 发明人 PARK, JUN HEE;CHO, HYUN MIN;LEE, SEUNG KI
分类号 G01R31/28;G01R1/073;G09F9/00 主分类号 G01R31/28
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