发明名称 PROGRAMMABLE TEST INSTRUMENT
摘要 <p>In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to a test instrument, and that is programmed to control operation of the test instrument, and a second processing system that is dedicated to device testing. The second processing system being programmable to run one or more test programs to test the device, and the first processing system has a first application programming interface (API) and the second processing system has a second API, the first API and the second API being different APIs, the first API and the second API having at least some duplicate functions.</p>
申请公布号 EP2771791(A1) 申请公布日期 2014.09.03
申请号 EP20120842878 申请日期 2012.09.20
申请人 TERADYNE, INC. 发明人 FRICK, LLOYD K.;LIND, DAVID JOHN
分类号 G06F11/22;G06F11/263 主分类号 G06F11/22
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