发明名称 SEMICONDUCTOR DEVICE HAVING INSULATING LAYER STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>In a semiconductor device including an insulating structure and a manufacturing method thereof, the semiconductor device has, in a substrate divided into a first region and a second region, a first pattern structure of a first height in the substrate of the first region. In the substrate of the second region, a second pattern structure of a second height which is higher than the first height is formed. On the substrate, included is an insulating structure which includes a protruding filler pattern which has an upper surface which is higher than the upper surface of the first pattern structure, has a shape which covers the first and the second pattern structure, and has at least one step-shaped sidewall on the boundary part of the first and second regions. The insulating structure has a structure for easy planarization due to polishing.</p>
申请公布号 KR20140105940(A) 申请公布日期 2014.09.03
申请号 KR20130019759 申请日期 2013.02.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 MIN, CHUNG KI
分类号 H01L21/31;H01L21/8242;H01L27/108 主分类号 H01L21/31
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