发明名称 Lithographic apparatus and device manufacturing method
摘要 An immersion lithography apparatus comprises a temperature controller configured to adjust a temperature of a projection system, a substrate and a liquid towards a common target temperature. Controlling the temperature of these elements and reducing temperature gradients may improve imaging consistency and general lithographic performance. Measures to control the temperature may include controlling the immersion liquid flow rate and liquid temperature, for example, via a feedback circuit.
申请公布号 US8823920(B2) 申请公布日期 2014.09.02
申请号 US201113287733 申请日期 2011.11.02
申请人 ASML Netherlands B.V. 发明人 Streefkerk Bob;Derksen Antonius Theodorus Anna Maria;Lof Joeri;Simon Klaus;Straaijer Alexander
分类号 G03B27/42;G03B27/52;G03F7/20 主分类号 G03B27/42
代理机构 Pillsbury Winthrop Shaw Pittman LLP 代理人 Pillsbury Winthrop Shaw Pittman LLP
主权项 1. A lithographic apparatus comprising: a movable table; a projection system configured to project a radiation beam onto a radiation-sensitive target portion of a substrate; and a liquid supply system configured to at least partly fill a space between the projection system and the table with a temperature controlled liquid, the liquid supply system comprising a liquid confinement member extending at least partly between the projection system and the table, the table being movable with respect to the liquid confinement member and the liquid confinement member comprising: a surface laterally extending from and around a path of the radiation beam through the liquid and facing toward the table,an outlet in the surface to remove liquid from the space, andan open aperture in at least part of the surface between the projection system and the table to allow fluid connection between the projection system and the table, wherein the liquid supply system is configured to provide a laminar flow of the temperature controlled liquid into a path of the radiation beam through the space.
地址 Veldhoven NL