发明名称 Semiconductor device
摘要 A semiconductor device includes: a first semiconductor layer; a second semiconductor layer; a two-dimensional carrier gas layer; a source electrode; a drain electrode; a gate electrode; and an auxiliary electrode located above the two-dimensional carrier gas layer between the gate electrode and the drain electrode. Channel resistance of the two-dimensional carrier gas layer between the gate electrode and the auxiliary electrode is set higher than channel resistance of the two-dimensional carrier gas layer between the gate electrode and the source electrode.
申请公布号 US8823061(B2) 申请公布日期 2014.09.02
申请号 US201113210950 申请日期 2011.08.16
申请人 Sanken Electric Co., Ltd. 发明人 Iwabuchi Akio;Aoki Hironori
分类号 H01L29/66;H01L29/778;H01L29/423;H01L29/10;H01L29/20 主分类号 H01L29/66
代理机构 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A semiconductor device, comprising: a first semiconductor layer; a second semiconductor layer provided on the first semiconductor layer with a heterojunction interface interposed therebetween; a two-dimensional carrier gas layer provided near the heterojunction interface in the first semiconductor layer; a source electrode electrically connected to one end of the two-dimensional carrier gas layer; a drain electrode electrically connected to the other end of the two-dimensional carrier gas layer; a gate electrode provided above the two-dimensional carrier gas layer between the source electrode and the drain electrode; and an auxiliary electrode provided above the two-dimensional carrier gas layer between the gate electrode and the drain electrode; and a first recess in the semiconductor layer spanning from the surface of the second semiconductor layer toward the heterojunction interface between the gate electrode and the auxiliary electrode forming a channel resistance of the two-dimensional carrier gas layer between the gate electrode and the auxiliary electrode that is higher relative to a channel resistance of the two-dimensional carrier gas layer between the gate electrode and the source electrode.
地址 Niiza-shi JP