| 摘要 |
The invention consists in a bench for calibrating and measuring tracing measures useful for detecting the measure error of a graded length by means of direct comparison using a movement sensitive linear decoder as a pattern, as well as a guide, a comparison turret formed by a system of conventional video (camera and screen) and a data processing element. This bench may solve the problem of times of inspection of said graded lengths, reducing the same in a considerable manner and improving the accuracy from 0.1 mm to 0.01 mm, simultaneously reducing the calibration and/or measurement uncertainty and allowing the operator to perform said task in an ergonomic form and with less fatigue since this may affect the health of the operator in a long term or midterm. |
