发明名称 Solution for removing residue after semiconductor dry process and method of removing the residue using the same
摘要 A residue-removing solution for removing residues present on semiconductor substrates after dry etching and/or ashing, the residue-removing solution comprising a Cu surface protective agent including: at least one compound selected from compounds (1), (2) and (3) each having as a basic skeleton a five-membered or six-membered heteratomic structure as defined herein; a compound capable of forming a complex or chelate with Cu (copper); and water. Further, the residue-removing solution has a pH of 4 to 9.
申请公布号 US8822396(B2) 申请公布日期 2014.09.02
申请号 US200812671419 申请日期 2008.08.21
申请人 Daikin Industries, Ltd. 发明人 Nakamura Shingo;Kezuka Takehiko
分类号 C11D7/32;H01L21/02;C11D11/00;C11D7/34 主分类号 C11D7/32
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A residue-removing solution for removing residues present on semiconductor substrates after dry etching and/or ashing, the residue-removing solution comprising: a Cu surface protective agent comprising at least one compound selected from the group consisting of: (1) indazoles;(2) at least one member selected from the group consisting of mercaptoimidazoles, mercaptooxazoles, mercaptothiazoles, mercaptobenzimidazoles, and mercaptobenzoxazoles; and(3) at least one member selected from the group consisting of pyrimidines, pyridazines, quinazolines, quinoxalines, and cinnolines; a compound capable of forming a complex or chelate with Cu being at least one member selected from the group consisting of keto acids; keto acid salts formed from keto acids and hydroxylamine, primary, secondary, or tertiary amines, quaternary ammonium, or polyamines; aldehyde acid salts formed from glyoxylic acid and hydroxylamine, primary, secondary, or tertiary amines, quaternary ammonium, or polyamines; polycarboxylic acid salts formed from malonic acid, succinic acid, glutaric acid, adipic acid, or malic acid, and hydroxylamine, alkanolamines, primary, secondary, or tertiary amines, quaternary ammonium, or polyamines; monochloroacetic acid, dichloroacetic acid, trichloroacetic acid, α-chlorobutanoic acid, β-chlorobutanoic acid, γ-chlorobutanoic acid, monofluoroacetic acid, difluoroacetic acid, trifluoroacetic acid, hydrobromic acid, perchloric acid, sulfuric acid, or malonic acid; a neutral organic solvent having an oxygen atom capable of coordinating to Cu; and monohydric alcohol with 4 or more carbon atoms; and water; and the residue-removing solution having a pH of 4 to 7.
地址 Osaka JP
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