发明名称 Memory state sensing based on cell capacitance
摘要 A memory cell and method for operating a memory cell including a bidirectional access device and memory element electrically coupled in series. The bidirectional access device includes a tunneling capacitance. The memory element programmable to a first and second state by application of a first and second write voltage opposite in polarity to one another. The memory element has a lower capacitance in the first state than the second state. A read unit senses a transient read current due to a voltage drop upon application of a read voltage. Determining if the memory element is the first or second state is based on whether the read current is greater or less than a sense threshold. The sense threshold is based on a capacitance ratio between the first and second state.
申请公布号 US8824190(B1) 申请公布日期 2014.09.02
申请号 US201313785602 申请日期 2013.03.05
申请人 International Business Machines Corporation 发明人 Kim SangBum;Lam Chung H.
分类号 G11C11/24;G11C7/00;G11C7/06;G11C11/404;G11C11/4091;G11C13/00 主分类号 G11C11/24
代理机构 代理人 Tuchman Ido;Percello Louis J.
主权项 1. A memory cell comprising: a bidirectional access device including a tunneling capacitance; a memory element electrically coupled in series circuit with the bidirectional access device, the memory element programmable to one of a first state and a second state, the memory element having a first capacitance at the first state and a second capacitance at the second state, the first capacitance being lower than the second capacitance, the memory element programmable to the first state by application of a first write voltage and programmable to the second state by application of a second write voltage in opposite polarity to the first write voltage; and a read unit configured to sense a transient read current due to a voltage drop across the memory element and bidirectional access device upon application of a read voltage.
地址 Armonk NY US