发明名称 Stack semiconductor apparatus having a through silicon via and method of fabricating the same
摘要 In a semiconductor apparatus, a plurality of semiconductor chips including through-silicon vias are stacked in a vertical direction, wherein the through-silicon via formed in each semiconductor chip protrudes beyond heights of each semiconductor chip.
申请公布号 US8823181(B2) 申请公布日期 2014.09.02
申请号 US201213604449 申请日期 2012.09.05
申请人 SK Hynix Inc. 发明人 Kim Chul;Lee Jong Chern
分类号 H01L23/48;H01L23/52;H01L29/40;H01L23/04;H01L23/02;H01L23/12;H01L25/065;H01L23/498;H01L23/00;H01L21/768 主分类号 H01L23/48
代理机构 William Park & Associates Ltd. 代理人 William Park & Associates Ltd.
主权项 1. A semiconductor apparatus comprises: a plurality of semiconductor chips stacked in a vertical direction and including through-silicon vias; and a conductive connection member formed in order to electrically couple the plurality of semiconductor chips, wherein each semiconductor chip comprises: a substrate formed through the through-silicon via and including a first surface and a second surface;an insulating layer formed on the first surface of the substrate; anda bump formed in the insulating layer and including a first surface contacted to the conductive connection member and a second surface contacted to the through-silicon via, wherein a width of the first surface of the bump is wider than that of the second surface, and wherein the through-silicon via is configured to be protruded from the second surface of the substrate and the conductive connection member is formed to surround a protruding portion of the through-silicon via.
地址 Gyeonggi-do KR