发明名称 |
Stack semiconductor apparatus having a through silicon via and method of fabricating the same |
摘要 |
In a semiconductor apparatus, a plurality of semiconductor chips including through-silicon vias are stacked in a vertical direction, wherein the through-silicon via formed in each semiconductor chip protrudes beyond heights of each semiconductor chip. |
申请公布号 |
US8823181(B2) |
申请公布日期 |
2014.09.02 |
申请号 |
US201213604449 |
申请日期 |
2012.09.05 |
申请人 |
SK Hynix Inc. |
发明人 |
Kim Chul;Lee Jong Chern |
分类号 |
H01L23/48;H01L23/52;H01L29/40;H01L23/04;H01L23/02;H01L23/12;H01L25/065;H01L23/498;H01L23/00;H01L21/768 |
主分类号 |
H01L23/48 |
代理机构 |
William Park & Associates Ltd. |
代理人 |
William Park & Associates Ltd. |
主权项 |
1. A semiconductor apparatus comprises:
a plurality of semiconductor chips stacked in a vertical direction and including through-silicon vias; and a conductive connection member formed in order to electrically couple the plurality of semiconductor chips, wherein each semiconductor chip comprises:
a substrate formed through the through-silicon via and including a first surface and a second surface;an insulating layer formed on the first surface of the substrate; anda bump formed in the insulating layer and including a first surface contacted to the conductive connection member and a second surface contacted to the through-silicon via, wherein a width of the first surface of the bump is wider than that of the second surface, and wherein the through-silicon via is configured to be protruded from the second surface of the substrate and the conductive connection member is formed to surround a protruding portion of the through-silicon via. |
地址 |
Gyeonggi-do KR |