| 摘要 |
<p>An optical inspection system for an electric circuit device and a method thereof are provided to precisely and rapidly detect defects of an electric circuit device through an automated process. An optical inspection system(100) for an electric circuit device comprises an optical inspection section, an algorithm inspection section, a display device, and a display controller. The optical inspection section provides an optical inspection result relative to at least one area on the electric circuit device subject to the inspection. The algorithm inspection section provides an algorithm inspection result relative to at least one area on the electric circuit device subject to the inspection. The algorithm inspection result represents existence of defect on the area. The display controller displays inconsistency between worker's behavior and the algorithm inspection result.</p> |
