| 摘要 |
An appearance inspection device and an appearance inspection method, capable of teaching a line pattern having an arbitrary shape as a portion to be inspected, in relation to a captured image of an inspection object, by a simple teaching operation. The device has an image storing part, a teaching part, an inspecting part and an inspection factor storing part. The teaching part obtains an image of the inspection object in the teaching process, and teaches the position of an inspection point, the position and the angle of an inspection region relative to the inspection point, the inspection factor and a judgment condition. The teaching factor storing part stores a setting parameter and a teaching factor. The inspecting part executes inspection based on the teaching factor in the inspecting process. |
| 主权项 |
1. An appearance inspection device for inspecting an appearance of an inspection object, comprising:
an image storing part which stores a first image obtained by capturing a reference object corresponding to the inspection object and a second image obtained by capturing the inspection object; a teaching part which teaches, on the first image, a portion to be inspected of the inspection object as a reference inspection line, defines a reference inspection region associated with one reference inspection point on the inspection reference line, determines an inspection factor inspected within the reference inspection region, and determines a judgment condition for judging as to whether a result of inspection based on the inspection factor passes or fails; a teaching factor storing part which stores a position and a shape of the reference inspection line, a position of the reference inspection point, a position and a size of the reference inspection region, the inspection factor and the judgment condition; and an inspecting part which overlaps the reference inspection line on the second image as an actual inspection line, generates a plurality inspection points on the actual inspection line, generates an inspection region in relation to each inspection point so that a positional relationship between the inspection point and the inspection region is the same as a positional relationship between the reference inspection point and the reference inspection region, inspects each of generated inspection regions based on the inspection factor, judges as to whether each inspection point passes or fails based on the judgment condition in relation to a result of executed inspection, and comprehensively judges as to whether the inspection object passes or fails based on a result of judgment of each inspection point. |
