发明名称 Semiconductor Device and Method of Forming a Vertical Interconnect Structure for 3-D FO-WLCSP
摘要 A semiconductor device is made by forming a first conductive layer over a carrier. The first conductive layer has a first area electrically isolated from a second area of the first conductive layer. A conductive pillar is formed over the first area of the first conductive layer. A semiconductor die or component is mounted to the second area of the first conductive layer. A first encapsulant is deposited over the semiconductor die and around the conductive pillar. A first interconnect structure is formed over the first encapsulant. The first interconnect structure is electrically connected to the conductive pillar. The carrier is removed. A portion of the first conductive layer is removed. The remaining portion of the first conductive layer includes an interconnect line and UBM pad. A second interconnect structure is formed over a remaining portion of the first conductive layer is removed.
申请公布号 US2014239495(A1) 申请公布日期 2014.08.28
申请号 US201414267800 申请日期 2014.05.01
申请人 STATS ChipPAC, Ltd. 发明人 Lin Yaojian;Bao Xusheng;Chen Kang;Fang Jianmin
分类号 H01L23/538;H01L23/31;H01L23/00 主分类号 H01L23/538
代理机构 代理人
主权项 1. A method of making a semiconductor device, comprising: providing a first conductive layer; forming a conductive pillar over a first portion of the first conductive layer; disposing a semiconductor die over a second portion of the first conductive layer; and forming an interconnect structure over the first portion of the first conductive layer and second portion of the first conductive layer.
地址 Singapore SG