发明名称 AUTOMATED ANALYZER
摘要 <p>When using, in a device, a test sample that has a time restriction for being held in the device, the time limit on the use of the test sample may be exceeded due to being in testing standby status when a plurality of tests with long measurement times are ordered. To address this problem, the hold time for the test sample is calculated from the input information of the content of an order and the time the sample can be held is displayed, thereby allowing determination on when to start preparing the test sample. Furthermore, a test sample holding unit (201) is locked until a time at which the usage time limit is observed, allowing a test order button to be pressed at a time when ordering a test is possible, and the lock on the test sample holding unit (201) is released after the button is pressed, thereby preventing holding a test sample for which a user erroneously did not observe the usage time limit. Moreover, the test start time limit is displayed at the time of order, thereby allowing the time limit on the use of the test sample to be prevented from being exceeded due to the tester pressing the start button too late.</p>
申请公布号 WO2014129271(A1) 申请公布日期 2014.08.28
申请号 WO2014JP51878 申请日期 2014.01.29
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MAEDA KOSHI;MORISHIMA DAISUKE;SAKAMOTO NAOTO;FUJITA HIROKO
分类号 G01N35/02 主分类号 G01N35/02
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