发明名称 Through Vias and Methods of Formation Thereof
摘要 In accordance with an embodiment of the present invention, a semiconductor chip includes a device region disposed in or over a substrate, a doped region disposed in the device region, and a through via disposed in the substrate. The through via extends through the doped region.
申请公布号 US2014239411(A1) 申请公布日期 2014.08.28
申请号 US201313776153 申请日期 2013.02.25
申请人 INFINEON TECHNOLOGIES AG 发明人 Brech Helmut;Birner Albert
分类号 H01L23/498;H01L21/768 主分类号 H01L23/498
代理机构 代理人
主权项 1. A semiconductor chip comprising: a device region disposed in or over a substrate; a first doped region disposed in the device region; and a first through via disposed in the substrate and extending through the first doped region.
地址 Neubiberg DE