Resistance measurement system and method of using the same
摘要
<p>A quality control system for the manufacture of carbon nanostructure-laden substrates includes a resistance measurement module for continuously measuring resistance of the carbon nanostructure (CNS)-laden substrate.</p>
申请公布号
AU2013230042(A1)
申请公布日期
2014.08.28
申请号
AU20130230042
申请日期
2013.03.05
申请人
APPLIED NANOSTRUCTURED SOLUTIONS, LLC
发明人
MALECKI, HARRY C.;GAIGLER, RANDY L.;FLEISCHER, COREY A.;LIU, HAN;MALET, BRANDON K.;MARKKULA, SAMUEL J.
