发明名称 TESTING SYSTEM AND METHOD OF INTER-INTEGRATED CIRCUIT BUS
摘要 A testing system configured to test real-time signals of an I2C bus of a motherboard includes an oscillograph and a testing device. The motherboard comprises an I2C master control device and an I2C slave device connected to the I2C master control device by the I2C bus. The oscillograph is connected to the I2C bus and configured to collect the real-time signals of the I2C bus. The testing device is connected to the motherboard and the oscillograph. The testing device is configured to send a testing command to start the I2C master control device and determine whether the real-time signals comply with predetermined parameters. The testing device is further configured to generate a testing report depicting whether the real-time signals comply with the predetermined parameters.
申请公布号 US2014244203(A1) 申请公布日期 2014.08.28
申请号 US201314083605 申请日期 2013.11.19
申请人 HON HAI PRECISION INDUSTRY CO., LTD. ;HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD. 发明人 HU HAO
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项 1. A testing system configured to test real-time signals of an Inter Integrated Circuit (I2C) bus of a tested motherboard, the tested motherboard comprising an I2C master control device and an I2C slave device connected to the I2C master control device by the I2C bus, and the testing system comprising: an oscillograph connected to the I2C bus and configured to collect the real-time signals of the I2C bus; and a testing device connected to the tested motherboard and the oscillograph; the testing device being configured to send a testing command causing the I2C master control device to send the real-time signals to the I2C slave device, to determine whether the real-time signals complies with predetermined rules, to generate a testing report depicting whether the real-time signals complies with the predetermined rules.
地址 New Taipei TW