发明名称 IMAGING APPARATUS AND IMAGE PROCESSING METHOD
摘要 Disclosed is an imaging apparatus for generating data of a phase image based on an interference pattern acquired by a shearing interferometer, including: a differential phase data calculating unit that calculates first differential phase data expressing a change of a phase in a first direction and second differential phase data expressing a change of a phase in a second direction, based on interference pattern data generated by an electromagnetic wave transmitted through a subject; a second-order differential phase data calculating unit that calculates first second-order differential phase data by differentiating the first differential phase data in the first direction, and calculates second second-order differential phase data by differentiating the second differential phase data in the second direction; and a phase data calculating unit that calculates the phase image by solving a second-order differential equation including the first and second second-order differential phase data as functions.
申请公布号 US2014241632(A1) 申请公布日期 2014.08.28
申请号 US201214347270 申请日期 2012.11.02
申请人 CANON KABUSHIKI KAISHA 发明人 Nagai Kentaro;Takeda Mitsuo
分类号 G06K9/62;G01J9/02 主分类号 G06K9/62
代理机构 代理人
主权项 1. An imaging apparatus for generating data of a phase image based on an interference pattern acquired by a shearing interferometer, comprising: a differential phase data calculating unit that calculates first differential phase data expressing a change of a phase in a first direction and second differential phase data expressing a change of a phase in a second direction which intersects the first direction, based on data of an interference pattern generated by an electromagnetic wave transmitted through a subject; a second-order differential phase data calculating unit that calculates first second-order differential phase data by differentiating the first differential phase data in the first direction, and calculates second second-order differential phase data by differentiating the second differential phase data in the second direction; and a phase data calculating unit that calculates the data of the phase image of the subject by solving a second-order differential equation including the first second-order differential phase data and the second second-order differential phase data as functions.
地址 Tokyo JP