发明名称 |
IMAGING APPARATUS AND IMAGE PROCESSING METHOD |
摘要 |
Disclosed is an imaging apparatus for generating data of a phase image based on an interference pattern acquired by a shearing interferometer, including: a differential phase data calculating unit that calculates first differential phase data expressing a change of a phase in a first direction and second differential phase data expressing a change of a phase in a second direction, based on interference pattern data generated by an electromagnetic wave transmitted through a subject; a second-order differential phase data calculating unit that calculates first second-order differential phase data by differentiating the first differential phase data in the first direction, and calculates second second-order differential phase data by differentiating the second differential phase data in the second direction; and a phase data calculating unit that calculates the phase image by solving a second-order differential equation including the first and second second-order differential phase data as functions. |
申请公布号 |
US2014241632(A1) |
申请公布日期 |
2014.08.28 |
申请号 |
US201214347270 |
申请日期 |
2012.11.02 |
申请人 |
CANON KABUSHIKI KAISHA |
发明人 |
Nagai Kentaro;Takeda Mitsuo |
分类号 |
G06K9/62;G01J9/02 |
主分类号 |
G06K9/62 |
代理机构 |
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代理人 |
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主权项 |
1. An imaging apparatus for generating data of a phase image based on an interference pattern acquired by a shearing interferometer, comprising:
a differential phase data calculating unit that calculates first differential phase data expressing a change of a phase in a first direction and second differential phase data expressing a change of a phase in a second direction which intersects the first direction, based on data of an interference pattern generated by an electromagnetic wave transmitted through a subject; a second-order differential phase data calculating unit that calculates first second-order differential phase data by differentiating the first differential phase data in the first direction, and calculates second second-order differential phase data by differentiating the second differential phase data in the second direction; and a phase data calculating unit that calculates the data of the phase image of the subject by solving a second-order differential equation including the first second-order differential phase data and the second second-order differential phase data as functions. |
地址 |
Tokyo JP |