发明名称 |
PHOTOELECTRIC CONVERSION DEVICE AND MANUFACTURING METHOD THEREOF, AND PHOTOELECTRIC CONVERSION MODULE |
摘要 |
A photoelectric conversion device in which a substantially intrinsic i-type amorphous hydrogen-containing semiconductor layer, a p-type amorphous hydrogen-containing semiconductor layer, and a first transparent conductive layer are stacked in this order on a first surface of an n-type semiconductor substrate that generates a photogenerated carrier by receiving light, wherein the first transparent conductive layer includes a hydrogen-containing area formed of a transparent conductive material that contains hydrogen and a hydrogen-diffusion suppression area that is present on a side of the p-type amorphous hydrogen-containing semiconductor layer with respect to the hydrogen-containing area and that is formed of a transparent conductive material that does not substantially contain hydrogen, and the hydrogen-diffusion suppression area has a hydrogen concentration distribution in which a hydrogen content on a side of the p-type amorphous hydrogen-containing semiconductor layer is lower than that on a side of the hydrogen-containing area. |
申请公布号 |
US2014238476(A1) |
申请公布日期 |
2014.08.28 |
申请号 |
US201214347826 |
申请日期 |
2012.04.10 |
申请人 |
Konishi Hirofumi;Matsuura Tsutomu;Nishikawa Yusuke;Sugawara Katsutoshi |
发明人 |
Konishi Hirofumi;Matsuura Tsutomu;Nishikawa Yusuke;Sugawara Katsutoshi |
分类号 |
H01L31/0224;H01L31/18;H01L31/075 |
主分类号 |
H01L31/0224 |
代理机构 |
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代理人 |
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主权项 |
1: A photoelectric conversion device in which a substantially intrinsic semiconductor layer, a p-type semiconductor layer, and a transparent conductive layer are stacked in this order on a first surface of an n-type semiconductor substrate that generates a photogenerated carrier by receiving light, wherein
the transparent conductive layer includes a hydrogen-containing area formed of a transparent conductive material that contains hydrogen and a hydrogen-diffusion suppression area that is present on a side of the p-type semiconductor layer with respect to the hydrogen-containing area and that is formed of a transparent conductive material that does not substantially contain hydrogen, the hydrogen-diffusion suppression area has a hydrogen concentration distribution in which a hydrogen content on a side of the p-type semiconductor layer is lower than a hydrogen content on a side of the hydrogen-containing area, a hydrogen concentration of the hydrogen-diffusion suppression area is equal to or lower than 1 at %, and a hydrogen concentration of the hydrogen-containing area is higher than 1 at %. |
地址 |
Tokyo JP |