发明名称 SEMICONDUCTOR DEVICE
摘要 Disclosed is a semiconductor device including two oxide semiconductor layers, where one of the oxide semiconductor layers has an n-doped region while the other of the oxide semiconductor layers is substantially i-type. The semiconductor device includes the two oxide semiconductor layers sandwiched between a pair of oxide layers which have a common element included in any of the two oxide semiconductor layers. A double-well structure is formed in a region including the two oxide semiconductor layers and the pair of oxide layers, leading to the formation of a channel formation region in the n-doped region. This structure allows the channel formation region to be surrounded by an i-type oxide semiconductor, which contributes to the production of a semiconductor device that is capable of feeding enormous current.
申请公布号 US2014239293(A1) 申请公布日期 2014.08.28
申请号 US201414174438 申请日期 2014.02.06
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 YAMAZAKI Shunpei;SUZAWA Hideomi;SHIMOMURA Akihisa;TANAKA Tetsuhiro;TEZUKA Sachiaki
分类号 H01L29/78;H01L29/26 主分类号 H01L29/78
代理机构 代理人
主权项 1. A semiconductor device comprising: a transistor which includes: a first oxide layer;a first oxide semiconductor layer over and in contact with the first oxide layer, the first oxide semiconductor layer including a first region containing an impurity;a second oxide semiconductor layer over and in contact with the first region; anda second oxide layer over and in contact with the second oxide semiconductor layer.
地址 Atsugi-shi JP